Bonsoir,
Pour la commande smarctl
[root@localhost ~]# smartctl --all /dev/sdb
smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.18.16-300.fc29.x86_64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 860 EVO 250GB
Serial Number: S3YJNB0K293676R
LU WWN Device Id: 5 002538 e40184bf9
Firmware Version: RVT01B6Q
User Capacity: 250059350016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Nov 6 21:29:03 2018 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1248
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 788
177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 8
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 076 053 000 Old_age Always - 24
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 104
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 4334168186
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[root@localhost ~]#
Pour le 2e SSSD
[root@localhost ~]# smartctl --all /dev/sda
smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.18.16-300.fc29.x86_64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, [url=http://www.smartmontools.org]www.smartmontools.org[/url]
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 860 EVO 250GB
Serial Number: S3YJNB0K133325X
LU WWN Device Id: 5 002538 e400777e0
Firmware Version: RVT01B6Q
User Capacity: 250059350016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Nov 6 21:31:08 2018 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1255
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 790
177 Wear_Leveling_Count 0x0013 099 099 000 Pre-fail Always - 16
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 077 051 000 Old_age Always - 23
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 103
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 5924642455
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[root@localhost ~]#
Par acquis de conscience , pour la température
[root@localhost ~]# sensors
coretemp-isa-0000
Adapter: ISA adapter
Package id 0: +28.0°C (high = +82.0°C, crit = +102.0°C)
Core 0: +27.0°C (high = +82.0°C, crit = +102.0°C)
Core 1: +26.0°C (high = +82.0°C, crit = +102.0°C)
acpitz-virtual-0
Adapter: Virtual device
temp1: +27.8°C (crit = +103.0°C)
temp2: +29.8°C (crit = +103.0°C)
nouveau-pci-0100
Adapter: PCI adapter
GPU core: +0.88 V (min = +0.82 V, max = +1.09 V)
fan1: 1320 RPM
temp1: +36.0°C (high = +95.0°C, hyst = +3.0°C)
(crit = +105.0°C, hyst = +5.0°C)
(emerg = +135.0°C, hyst = +5.0°C)
[root@localhost ~]#
Concernant le memtest86+ il ne dépasse pas 40 % puis reboote